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KMID : 1102020170470010003
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Applied Microscopy
2017 Volume.47 No. 1 p.3 ~ p.7
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Current Status of Automatic Serial Sections for 3D Electron Microscopy
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Choi Hyo-Sun
Jung Min-Kyo
Mun Ji-Young
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Abstract
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The automatic equipment for three-dimensional electron microscopy (3DEM) can acquire serial sections of a large sample in a relatively short time, and is especially suitable for the connectomics, which is a field related to understanding the brain structure as a whole. As many results obtained through 3DEM using automatic serial sections have been published in the field of brain research, many researchers continue to apply this technique to various samples. We reviewed the equipment for automatic serial sectioning, the block preparation method, the limitations of 3DEM, and future directions.
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KEYWORD
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Automatic serial sections, Three-dimensional electron microscopy, Correlative light and volume electron microscopy
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